SN74ABT574AN Soortgelijke

SN74BCT8374ADWR
- SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SN74ABT623N
- OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
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- OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
SN74S260D
- DUAL 5-INPUT POSITIVE-NOR GATES
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- 3.3 V ABT 16-BIT BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
SN7405N3
- HEX INVERTERS WITH OPEN COLLECTOR OUTPUTS
SN74AHC74PWLE
- DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
SN74HC02DBR
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74ABT574AN Datasheet en spec

Fabrikant : TI

Verpakking :

Pins : 20

Temperatuur : Min -40 °C | Max 85 °C

Grootte : 119 KB

Toepassing : OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS