SN74LVTH540DBR Soortgelijke

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- SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
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- DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
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- QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74LVTH540DBR Datasheet en spec

Fabrikant : TI

Verpakking : DB

Pins : 20

Temperatuur : Min -40 °C | Max 85 °C

Grootte : 113 KB

Toepassing : 3.3V ABT OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS