SN74S38DR Soortgelijke

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- SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
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- OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
SN74S260D
- DUAL 5-INPUT POSITIVE-NOR GATES
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- 3.3 V ABT 16-BIT BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
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- HEX INVERTERS WITH OPEN COLLECTOR OUTPUTS
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- DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
SN74HC02DBR
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74S38DR Datasheet en spec

Fabrikant : TI

Verpakking :

Pins : 14

Temperatuur : Min 0 °C | Max 70 °C

Grootte : 212 KB

Toepassing : QUAD 2-INPUT POSITIVE-NAND BUFFERS WITH OPEN COLLECTOR OUTPUTS